BS IEC 63003-2015 pdf free download – Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505 TM
1.2 Purpose
Standardization of a common input/output (IO) will cenable the interoperability of IEEE 1505 compliantinterface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnectingdevices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
1.3 Statement of the problem
1.3.1 U.S.Government guidance
From 1980 to 1992,the U.S. Department of Defense (DoD) investment in field,depot, and factoryautomatic test systems (ATS) exceeded $35 billion with an additional $15 billion for associated support.Most of this test capability was acquired as part of individual weapon system procurements. This led to aproliferation of different custom equipment types with unique interfaces.Recent policy decisions havechanged the direction of the purchase of test equipment towards a standards based approach with bothhardware and software critical interface requirements.
The U.S. DoD Instruction 5000.2-R1 ATS Policy states: “ATS capabilities shall be defined through criticalhardware and software elements” (see [B2]3). This policy however, did not define these critical elements.The Critical Interfaces Project was created to define critical ATS clements.
1.3.2 Critical lnterfaces Project
The Factory-to-Field Integration of Defense Test Systems Project (commonly referred to as the CriticalInterfaces Projecf) was started in the latter part of i995. The Critical Interfaccs Working Group (CIWG)within the Joint-Service ATS Research and Development Integrated Product Team (ARI) was establishedto perform the project.The ATS Executive Agent Office (EAO) has provided project management andcoordination among the Air Force, Army, Marine Corps, and Navy participants. In addition, many industryrepresentatives have participated. The CIWG published their findings in the Automatic Test SystemCritical Interfaces Report [B1] and this report served as the basis for the development of the RFIarchitecture and subsequent specification.
The objective of the Critical Interfaces Project was to demonstrate the feasibility of reducing the cost to re-host test program sets (TPSs) and increase the interoperability of TPS software among the military servicesby using standardized interfaces.
Interfaces that offer the potential to achieve this objective are deemed critical. Potential savings will bequantified through demonstration. The Automatic Test System Critical Interfaces Report [B1] is maintainedby the ATS EA0 and provides guidance to DoD ATE acquisition programs. This document also addressedthe requirements of DoD Regulation 5000.2-R1 [B2] and assisted in migrating the DoD designated testerfamilies towards a common solution. The Hardware Interfaces (HI) Subcommittee of the IEEE StandardsCoordinating Committee on Test and Diagnosis for Electronic Systems (sCC20) applied therecommendations of the report as it related to the RFI, to the extent that the current RFl standard is in fullcompliance with the report.
1.3.3 CTIwG guidance recommendations
During the Common Test Interface Working Group(CTIWG) October 2003 meeting, the DoD providedthe following recommendations as guidance for the Working Group’s success:
a) Identify a modular/scaleable interface
b) Allow use of different size ID/fixture on the same general purpose interface (GPI)
c) Ensure TPS hardware compatibility as interface grows
d) Provide legacy system support
e) Provide a transition path to support legacy TPS hardware
f) Adhere to an open architecture system
g) Built to one specification
h) Multiple sources
i) Non-proprietary design and components
j) Ensure capabilities that provision for growth and special requirements
k) Provide room for future expansion and TPS requirements
l) Support and Promote the use of commercial-off-the-shelf (COTS) interconnect components
m) Use industry standard connector technology
1.3.4 CTIWG legacy test program set support
In support of these recommendations, the CTI architecture shall assure past legacy and future TPS plug and play compatibility between defense agencies and defense-aerospace suppliers. Areas addressed by the CTIWG include:
a) Pin mapping
b) Scalability
c) TPS legacy support
d) Connector parametric (dc to light)
e) Reliability and maintainability
f) Physical
g) Switching
h) Design-to-cost factors.BS IEC 63003 pdf download.